Development of a Primary Ion Column for Mass Spectrometry-Based Surface Analysis Thesis

thesis or dissertation chair

fiu authors

  • Villacob, Raul A

abstract

  • Secondary Ion Mass Spectrometry (SIMS) is a powerful technique for high spatial resolution chemical mapping and characterization of native surfaces. The use of massive cluster projectiles has been shown to extend the applicable mass range of SIMS and improve secondary ion yields 100 fold or beyond. These large projectiles however, present a challenge in terms of focusing due to the initial spatial and kinetic energy spreads inherent to their generation. In the present work, we describe the development and construction of a novel primary ion (PI) column employing a gold nanoparticle – liquid metal ion source (AuNP-LMIS) and the coupling to ultrahigh resolution mass spectrometers (e.g., Fourier Transform Ion Cyclotron Resonance Mass Spectrometer, FT-ICR MS) for accurate chemical characterization of complex biological surfaces. This work describes the ion dynamics, development and the experimental characterization of the AuNP-LMIS.

publication date

  • July 1, 2016

keywords

  • Analytical Chemistry
  • Focused Ion Beams
  • Mass Spectrometry
  • Mass Spectrometry Imaging
  • Nanoscale Imaging
  • Scientific Instrumentation Development
  • Surface Analysis

Digital Object Identifier (DOI)