Urban, Frank
- Associate Professor, Electrical and Computer Engineering , College of Engineering and Computing
Scholarly & Creative Works
selected publications
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Article
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2021Numerical ellipsometry: A method for selecting a near-minimal infrared measurement set for beta-gallium oxideFull Text via DOI: 10.1116/6.0001002 Web of Science: 000672155600001
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2021Decreased maximal cortisol secretion rate in patients with cirrhosis: Relation to disease severityFull Text via DOI: 10.1016/j.jhepr.2021.100277 Web of Science: 000658290100016
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2021Muscle fatigue modelling: Solving for fatigue and recovery parameter values using fewer maximum effort assessmentsFull Text via DOI: 10.1016/j.ergon.2021.103104 Web of Science: 000633216000003
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2020Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to beta-gallium oxideFull Text via DOI: 10.1116/1.5134790 Web of Science: 000514654700002
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2018Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic filmsFull Text via DOI: 10.1016/j.tsf.2018.07.047 Web of Science: 000443012200018
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2017Comparison of three methods for ellipsometry characterization of thin absorbing filmsFull Text via DOI: 10.1016/j.tsf.2017.06.060 Web of Science: 000416041400026
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2017Reactive sputter deposition and annealing of nanometer scale NiO thin films for metal-insulator-metal tunnel junction diodesFull Text via DOI: 10.1016/j.tsf.2017.06.063 Web of Science: 000416041400005
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2017Characterization of Cortisol Secretion Rate in Secondary Adrenal InsufficiencyFull Text via DOI: 10.1210/js.2017-00198 Web of Science: 000425348400017
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2015Reversible Increase in Maximal Cortisol Secretion Rate in Septic ShockFull Text via DOI: 10.1097/CCM.0000000000000721 Web of Science: 000349963600019
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2014Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k planeFull Text via DOI: 10.1016/j.tsf.2014.03.067 Web of Science: 000340658100007
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2013Multiband Optical Absorption Controlled by Lattice Strain in Thin-Film LaCrO3Full Text via DOI: 10.1103/PhysRevLett.110.077401 Web of Science: 000314869200017
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2012Estimation of Maximal Cortisol Secretion Rate in Healthy HumansFull Text via DOI: 10.1210/jc.2011-2227 Web of Science: 000302787800058
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2011Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k planeFull Text via DOI: 10.1016/j.tsf.2011.03.133 Web of Science: 000292720000015
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2011Numerical ellipsometry: n-k plane analysis of transparent conducting filmsFull Text via DOI: 10.1116/1.3589803 Web of Science: 000292639500016
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2009Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence anglesFull Text via DOI: 10.1016/j.tsf.2009.09.071 Web of Science: 000272861500013
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2009Validation of a simple method of estimating plasma free cortisol: Role of cortisol binding to albuminFull Text via DOI: 10.1016/j.clinbiochem.2008.09.115 Web of Science: 000262456200012
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2008Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulatorsFull Text via DOI: 10.1016/j.tsf.2008.05.041 Web of Science: 000262053800012
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2007Ellipsometer analysis in the n-k planeFull Text via DOI: 10.1016/j.tsf.2007.06.080 Web of Science: 000252037500004
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2006Ellipsometer measurements using focused and masked beamsFull Text via DOI: 10.1016/j.tsf.2006.07.060 Web of Science: 000242639600014
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2005Partially ionized beam deposition of paryleneFull Text via DOI: 10.1016/j.jnoncrysol.2005.08.027 Web of Science: 000233151200019
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2003Nanoparticle beam formation and investigation of gold nanostructured filmsFull Text via DOI: 10.1116/1.1615985 Web of Science: 000188193600007
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2002Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometryFull Text via DOI: 10.1016/S0040-6090(02)00082-2 Web of Science: 000175889200032
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2001Irreversible magnetization in nickel nanoparticlesFull Text via DOI: 10.1016/S0304-8853(00)01379-2 Web of Science: 000168329200004
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1999Interesting optical properties of films composed of very small grains formed from a high-rate nanoparticle beamFull Text via DOI: 10.1016/S0257-8972(99)00373-4 Web of Science: 000084500800089
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1998Extremely fast ellipsometry solutions using cascaded neural networks aloneFull Text via DOI: 10.1016/S0040-6090(98)01201-2 Web of Science: 000077202500011
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1998Toward a priori selection of ellipsometry angles and wavelengths using a high performance semantic databaseFull Text via DOI: 10.1016/S0040-6090(97)00783-9 Web of Science: 000073761700020
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1997Sensitivity of variable angle spectroscopic ellipsometry to isotropic thin film propertiesFull Text via DOI: 10.1016/S0040-6090(97)00670-6 Web of Science: 000071553400007
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1997Deconvolution of tip affected atomic force microscope images and comparison to Rutherford backscattering spectrometryFull Text via DOI: 10.1116/1.589412 Web of Science: A1997XT08800006
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1996An algorithm for analyzing ellipsometric data taken with multiple angles of incidenceFull Text via DOI: 10.1016/S0040-6090(96)09186-9 Web of Science: A1996WB81900012
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1996Comparison of atomic force microscope and Rutherford backscattering spectrometry data of nanometre size zinc islandsFull Text via DOI: 10.1016/S0040-6090(96)08968-7 Web of Science: A1996WB81900061
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1996Numerical ellipsometry: Applications of a new algorithm for real-time, in situ film growth monitoringFull Text via DOI: 10.1116/1.580018 Web of Science: A1996VA96400052
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1996Numerical ellipsometry: Real-time solutions using mapping onto the complex index planeFull Text via DOI: 10.1116/1.580390 Web of Science: A1996UR13400023
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1996Optical properties of cobalt oxide films deposited by spray pyrolysisFull Text via DOI: 10.1116/1.580372 Web of Science: A1996UR13400005
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1995Numerical techniques useful in the practice of ellipsometryFull Text via DOI: 10.1016/0040-6090(95)06849-X Web of Science: A1995TM18700017
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1995Recent developments in ionized cluster beam thin film depositionFull Text via DOI: 10.1016/0040-6090(95)06845-7 Web of Science: A1995TM18700119
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1995Surface analysis algorithms for scanning probe microscopyFull Text via DOI: 10.1016/0040-6090(95)06708-6 Web of Science: A1995TM18700075
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1995INVESTIGATION OF SILVER IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUEFull Text via DOI: 10.1088/0022-3727/28/11/022 Web of Science: A1995TF19200022
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1994ADVANCED IMAGE-PROCESSING IN SCANNING PROBE MICROSCOPYFull Text via DOI: 10.1016/0040-6090(94)90341-7 Web of Science: A1994PX35600058
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1994GOLD AND ZINC THIN-FILMS DEPOSITED BY THE IONIZED CLUSTER BEAM TECHNIQUEFull Text via DOI: 10.1016/0040-6090(94)90356-5 Web of Science: A1994PX35600073
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1994NUMERICAL ELLIPSOMETRY - ENHANCEMENT OF NEW ALGORITHMS FOR REAL-TIME, IN-SITU FILM GROWTH MONITORINGFull Text via DOI: 10.1016/0040-6090(94)90332-8 Web of Science: A1994PX35600049
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1994REAL-TIME, IN-SITU ELLIPSOMETRY SOLUTIONS USING ARTIFICIAL NEURAL-NETWORK PREPROCESSINGFull Text via DOI: 10.1016/0040-6090(94)90894-X Web of Science: A1994NP81400028
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1993DETERMINATION OF ZINC CLUSTER-SIZE IN IONIZED CLUSTER BEAM FILM DEPOSITIONFull Text via DOI: 10.1063/1.354888 Web of Science: A1993LM78200089
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1993SELECTIVE-AREA DEPOSITION OF METAL-FILMS BY THE IONIZED CLUSTER BEAM METHODFull Text via DOI: 10.1063/1.109155 Web of Science: A1993LF99000019
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1993ELLIPSOMETRY ALGORITHM FOR ABSORBING FILMSFull Text via DOI: 10.1364/AO.32.002339 Web of Science: A1993KZ60800025
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1992DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR REAL-TIME, INSITU ELLIPSOMETRY DATA REDUCTIONFull Text via DOI: 10.1016/0040-6090(92)90580-5 Web of Science: A1992KA73500042
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1992FORMATION OF ZINC CLUSTERS IN IONIZED CLUSTER BEAM FILM DEPOSITIONFull Text via DOI: 10.1063/1.107639 Web of Science: A1992JM34100013
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1991STUDY OF THE IONIZED CLUSTER BEAM TECHNIQUEFull Text via DOI: 10.1116/1.577404 Web of Science: A1991FR76100032
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1990Study of the ionized cluster beam technique using energy-analyzed gold depositionsFull Text via DOI: 10.1063/1.345057
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Book Chapter
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1994Comparative Study of the Surface Roughness of Oxide Thin Films. 281-299.Full Text via DOI: 10.1007/978-1-4757-9322-2_29
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Conference
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2010Numerical ellipsometry: Analysis of thin metal layers using n-k-d twisted curve methods with multiple incidence angles. 947-952.Full Text via DOI: 10.1116/1.3439679 Web of Science: 000280479700085
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2002Nanophase films deposited from a high-rate, nanoparticle beam. 995-999.Full Text via DOI: 10.1116/1.1481749 Web of Science: 000176358300040
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1999Modeling of large cluster synthesis. 2364-2367.Full Text via DOI: 10.1116/1.581774 Web of Science: 000081485800104
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1999Nanophase copper thin films deposited from a beam source. 2374-2377.Full Text via DOI: 10.1116/1.581915 Web of Science: 000081485800106
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1997Determining the optical properties of a mixed-metal oxide film, Co3-x-yCrxFeyO4, with spectroscopic ellipsometry and atomic force microscopy. 998-1006.Full Text via DOI: 10.1116/1.580794 Web of Science: A1997XE73100103
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1996Analysis of surface void fraction using atomic force microscopy. 1957-1962.Full Text via DOI: 10.1116/1.580367 Web of Science: A1996UR13300113
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1994DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR IN-SITU ELLIPSOMETRY OF FILMS GROWING ON UNKNOWN SUBSTRATES. 1952-1956.Full Text via DOI: 10.1116/1.578988 Web of Science: A1994NZ03200029
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1993STUDY OF ZINC THIN-FILMS FORMED USING LARGE CLUSTERS IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE. 1916-1920.Full Text via DOI: 10.1116/1.586522 Web of Science: A1993MC57200027
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1993VIRTUAL INTERFACE METHOD FOR IN-SITU ELLIPSOMETRY OF FILMS GROWN ON UNKNOWN SUBSTRATES. 976-980.Full Text via DOI: 10.1116/1.578578 Web of Science: A1993LP00700044
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1992EFFECTS OF SPACE-CHARGE ON ION ENERGY IN IONIZED CLUSTER BEAM FILM DEPOSITION. 1488-1492.Full Text via DOI: 10.1116/1.578271 Web of Science: A1992JE68200016
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1990
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1990Developments in in-situ ellipsometer monitoring of thin film growth during reactive ion plating deposition. 133-146.Full Text via DOI: 10.1117/12.20372
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Letter
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2021Letter to the Editor: "Prevention of Adrenal Crisis: Cortisol Responses to Major Stress Compared to Stress Dose Hydrocortisone Delivery". E393-E394.Full Text via DOI: 10.1210/clinem/dgaa709 Web of Science: 000608480200041
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2020Letter to the Editor: "Dynamic Pituitary-Adrenal Interactions in the Critically ill After Cardiac Surgery". E3482-E3483.Full Text via DOI: 10.1210/clinem/dgaa418 Web of Science: 000574866500043
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Proceedings Paper
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1990Process Analysis of Thin Film Deposition with an In Situ Ellipsometer. 346-354.Full Text via DOI: 10.1117/12.962906
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Works By Students
chaired theses and dissertations
- Boudani, Nabil I., Cascade artificial neural networks technique for solving ellipsometry problems 1998
Contact
full name
- Frank Urban
Identifiers
ORCID iD
- https://orcid.org/0000-0002-2014-9166 (confirmed)
visualizations
publication subject areas
Citation index-derived subject areas the researcher has published in