Urban, Frank

Frank Urban
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Positions

Associate Professor, Electrical and Computer Engineering , College of Engineering and Computing

Contact Info

Frank.Urban@fiu.edu urban@fiu.edu

305-348-3705

selected publications

Article
- 2017
  
  Characterization of Cortisol Secretion Rate in Secondary Adrenal Insufficiency
  Full Text via DOI: 10.1210/js.2017-00198 PMID: 29264545 Web of Science: 000425348400017
- 2017
  
  Comparison of three methods for ellipsometry characterization of thin absorbing films. THIN SOLID FILMS. 644:182-189.
  Full Text via DOI: 10.1016/j.tsf.2017.06.060 Web of Science: 000416041400026
- 2017
  
  Reactive sputter deposition and annealing of nanometer scale NiO thin films for metal-insulator-metal tunnel junction diodes. THIN SOLID FILMS. 644:23-28.
  Full Text via DOI: 10.1016/j.tsf.2017.06.063 Web of Science: 000416041400005
- 2015
  
  Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates. THIN SOLID FILMS. 583:239-244.
  Full Text via DOI: 10.1016/j.tsf.2015.03.062 Web of Science: 000353812400037
- 2015
  
  Reversible Increase in Maximal Cortisol Secretion Rate in Septic Shock. CRITICAL CARE MEDICINE. 43:549-556.
  Full Text via DOI: 10.1097/CCM.0000000000000721 PMID: 25365720 Web of Science: 000349963600019
- 2014
  
  Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane. THIN SOLID FILMS. 562:49-55.
  Full Text via DOI: 10.1016/j.tsf.2014.03.067 Web of Science: 000340658100007
- 2013
  
  Multiband Optical Absorption Controlled by Lattice Strain in Thin-Film LaCrO3. PHYSICAL REVIEW LETTERS. 110.
  Full Text via DOI: 10.1103/PhysRevLett.110.077401 PMID: 25166405 Web of Science: 000314869200017
- 2012
  
  Estimation of Maximal Cortisol Secretion Rate in Healthy Humans. JOURNAL OF CLINICAL ENDOCRINOLOGY & METABOLISM. 97:1285-1293.
  Full Text via DOI: 10.1210/jc.2011-2227 PMID: 22337905 Web of Science: 000302787800058
- 2011
  
  Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane. THIN SOLID FILMS. 519:6284-6289.
  Full Text via DOI: 10.1016/j.tsf.2011.03.133 Web of Science: 000292720000015
- 2011
  
  Numerical ellipsometry: n-k plane analysis of transparent conducting films. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 29.
  Full Text via DOI: 10.1116/1.3589803 Web of Science: 000292639500016
- 2010
  
  Numerical ellipsometry: Analysis of thin metal layers using n-k-d twisted curve methods with multiple incidence angles. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 28:947-952.
  Full Text via DOI: 10.1116/1.3439679 Web of Science: 000280479700085
- 2009
  
  Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles. THIN SOLID FILMS. 518:1411-1414.
  Full Text via DOI: 10.1016/j.tsf.2009.09.071 Web of Science: 000272861500013
- 2009
  
  Validation of a simple method of estimating plasma free cortisol: Role of cortisol binding to albumin. CLINICAL BIOCHEMISTRY. 42:64-71.
  Full Text via DOI: 10.1016/j.clinbiochem.2008.09.115 PMID: 18976646 Web of Science: 000262456200012
- 2008
  
  Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates. THIN SOLID FILMS. 517:1081-1085.
  Full Text via DOI: 10.1016/j.tsf.2008.04.101 Web of Science: 000262053800015
- 2008
  
  Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators. THIN SOLID FILMS. 517:1063-1071.
  Full Text via DOI: 10.1016/j.tsf.2008.05.041 Web of Science: 000262053800012
- 2007
  
  Ellipsometer analysis in the n-k plane. THIN SOLID FILMS. 516:119-127.
  Full Text via DOI: 10.1016/j.tsf.2007.06.080 Web of Science: 000252037500004
- 2004
  
  Partially ionized beam deposition of parylene. JOURNAL OF NON-CRYSTALLINE SOLIDS. 351:3536-3541.
  Full Text via DOI: 10.1016/j.jnoncrysol.2005.08.027 Web of Science: 000233151200019
- 2002
  
  Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry. THIN SOLID FILMS. 408.
  Full Text via DOI: 10.1016/S0040-6090(02)00082-2 Web of Science: 000175889200032
- 2002
  
  Nanophase films deposited from a high-rate, nanoparticle beam. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 20.
  Full Text via DOI: 10.1116/1.1481749 Web of Science: 000176358300040
- 1999
  
  Interesting optical properties of films composed of very small grains formed from a high-rate nanoparticle beam. THIN SOLID FILMS. 355.
  Full Text via DOI: 10.1016/S0257-8972(99)00373-4 Web of Science: 000084500800089
- 1999
  
  Nanophase copper thin films deposited from a beam source. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 17.
  Full Text via DOI: 10.1116/1.581915 Web of Science: 000081485800106
- 1998
  
  Extremely fast ellipsometry solutions using cascaded neural networks alone. THIN SOLID FILMS. 332.
  Full Text via DOI: 10.1016/S0040-6090(98)01201-2 Web of Science: 000077202500011
- 1998
  
  Toward a priori selection of ellipsometry angles and wavelengths using a high performance semantic database. THIN SOLID FILMS. 313.
  Full Text via DOI: 10.1016/S0040-6090(97)00783-9 Web of Science: 000073761700020
- 1997
  
  Sensitivity of variable angle spectroscopic ellipsometry to isotropic thin film properties. THIN SOLID FILMS. 308.
  Full Text via DOI: 10.1016/S0040-6090(97)00670-6 Web of Science: 000071553400007
- 1996
  
  Numerical ellipsometry: Applications of a new algorithm for real-time, in situ film growth monitoring. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 14.
  Full Text via DOI: 10.1116/1.580018 Web of Science: A1996VA96400052
- 1994
  
  ADVANCED IMAGE-PROCESSING IN SCANNING PROBE MICROSCOPY. THIN SOLID FILMS. 253.
  Full Text via DOI: 10.1016/0040-6090(94)90341-7 Web of Science: A1994PX35600058
- 1994
  
  NUMERICAL ELLIPSOMETRY - ENHANCEMENT OF NEW ALGORITHMS FOR REAL-TIME, IN-SITU FILM GROWTH MONITORING. THIN SOLID FILMS. 253.
  Full Text via DOI: 10.1016/0040-6090(94)90332-8 Web of Science: A1994PX35600049
- 1994
  
  REAL-TIME, IN-SITU ELLIPSOMETRY SOLUTIONS USING ARTIFICIAL NEURAL-NETWORK PREPROCESSING. THIN SOLID FILMS. 245.
  Full Text via DOI: 10.1016/0040-6090(94)90894-X Web of Science: A1994NP81400028
- 1994
  
  DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR IN-SITU ELLIPSOMETRY OF FILMS GROWING ON UNKNOWN SUBSTRATES. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 12.
  Full Text via DOI: 10.1116/1.578988 Web of Science: A1994NZ03200029
- 1993
  
  DETERMINATION OF ZINC CLUSTER-SIZE IN IONIZED CLUSTER BEAM FILM DEPOSITION. JOURNAL OF APPLIED PHYSICS. 74.
  Full Text via DOI: 10.1063/1.354888 Web of Science: A1993LM78200089
- 1993
  
  SELECTIVE-AREA DEPOSITION OF METAL-FILMS BY THE IONIZED CLUSTER BEAM METHOD. APPLIED PHYSICS LETTERS. 62.
  Full Text via DOI: 10.1063/1.109155 Web of Science: A1993LF99000019
- 1993
  
  ELLIPSOMETRY ALGORITHM FOR ABSORBING FILMS. APPLIED OPTICS. 32.
  Full Text via DOI: 10.1364/AO.32.002339 Web of Science: A1993KZ60800025
- 1993
  
  STUDY OF ZINC THIN-FILMS FORMED USING LARGE CLUSTERS IN THE IONIZED CLUSTER BEAM DEPOSITION TECHNIQUE. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. 11.
  Full Text via DOI: 10.1116/1.586522 Web of Science: A1993MC57200027
- 1993
  
  VIRTUAL INTERFACE METHOD FOR IN-SITU ELLIPSOMETRY OF FILMS GROWN ON UNKNOWN SUBSTRATES. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 11.
  Full Text via DOI: 10.1116/1.578578 Web of Science: A1993LP00700044
- 1992
  
  DEVELOPMENT OF ARTIFICIAL NEURAL NETWORKS FOR REAL-TIME, INSITU ELLIPSOMETRY DATA REDUCTION. THIN SOLID FILMS. 220.
  Full Text via DOI: 10.1016/0040-6090(92)90580-5 Web of Science: A1992KA73500042
- 1992
  
  FORMATION OF ZINC CLUSTERS IN IONIZED CLUSTER BEAM FILM DEPOSITION. APPLIED PHYSICS LETTERS. 61.
  Full Text via DOI: 10.1063/1.107639 Web of Science: A1992JM34100013
- 1992
  
  EFFECTS OF SPACE-CHARGE ON ION ENERGY IN IONIZED CLUSTER BEAM FILM DEPOSITION. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 10.
  Full Text via DOI: 10.1116/1.578271 Web of Science: A1992JE68200016
Meeting Abstract
- 2017
  
  Use of numerical modeling analysis to obtain free cortisol secretion and elimination in patients with cirrhosis: Relationship to liver disease variables. HEPATOLOGY. 1034A-1034A.
  Web of Science: 000412089802306
- 2009
  
  ASSESSMENT OF MAXIMAL CORTISOL SECRETION RATES IN SECONDARY ADRENAL INSUFFICIENCY (AI) PATIEINTS AND IN HEALTHY CONTROLS USING ADVANCED NUMERICAL MODELING METHODS. JOURNAL OF INVESTIGATIVE MEDICINE.
  Web of Science: 000270092400062

chaired theses and dissertations

Boudani, Nabil I., Cascade artificial neural networks technique for solving ellipsometry problems 1998

teaching activities

EEE6332-RXA: Thin Film Engr Fall Term 2019
EEE6332-U01: Thin Film Engr Fall Term 2019
EEE6399-U01: Electronic Prop Mat Spring Term 2019
EEL3712-U02: Logic Design I Spring Term 2019
EEL4140-RXA: Filter Design Fall Term 2019
EEL4140-U01: Filter Design Fall Term 2019
EGN1002-U01: Engineering Orient Spring Term 2019
EGN1002-U05: Engineering Orient Fall Term 2019

full name

Frank Urban

visualizations

Recent publications and grants in Scholars@FIU

Co-author Network

research areas

Endocrinology & Metabolism
Engineering
Gastroenterology & Hepatology
General & Internal Medicine
Materials Science
Medical Laboratory Technology
Physics
Research & Experimental Medicine
Science & Technology - Other Topics