Numerical ellipsometry: Ellipsometer analysis in the n-k plane for select combinations of metals, semiconductors, and insulators Article

cited authors

  • Urban, F. K., III; Barton, D.

publication date

  • 2008

published in

Digital Object Identifier (DOI)

start page

  • 1063

end page

  • 1071

volume

  • 517

issue

  • 3

research area