Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates Article
Urban, F. K., III, Barton, D.. (2008). Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates
. THIN SOLID FILMS, 517(3), 1081-1085. 10.1016/j.tsf.2008.04.101