Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates Article

Urban, F. K., III, Barton, D.. (2008). Numerical Ellipsometry: Ellipsometer analysis in the n-k plane for growing films on unknown homogeneous, isotropic substrates and unknown, layered substrates . THIN SOLID FILMS, 517(3), 1081-1085. 10.1016/j.tsf.2008.04.101



cited authors

  • Urban, F. K., III; Barton, D.

fiu authors

publication date

  • 2008

published in

Digital Object Identifier (DOI)

start page

  • 1081

end page

  • 1085

volume

  • 517

issue

  • 3

research area