Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles Article Proceedings Paper

Urban, F. K., III, Barton, D., Tiwald, T.. (2009). Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles . THIN SOLID FILMS, 518(5), 1411-1414. 10.1016/j.tsf.2009.09.071



cited authors

  • Urban, F. K., III; Barton, D.; Tiwald, T.

fiu authors

publication date

  • 2009

published in

Digital Object Identifier (DOI)

start page

  • 1411

end page

  • 1414

volume

  • 518

issue

  • 5

research area