Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles Article Proceedings Paper
Urban, F. K., III, Barton, D., Tiwald, T.. (2009). Numerical ellipsometry: Analysis of thin metal layers using n-k plane methods with multiple incidence angles
. THIN SOLID FILMS, 518(5), 1411-1414. 10.1016/j.tsf.2009.09.071