Numerical ellipsometry: n-k plane analysis of transparent conducting films Article

Barton, D., Urban, F. K., III. (2011). Numerical ellipsometry: n-k plane analysis of transparent conducting films . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 29(4), 10.1116/1.3589803



cited authors

  • Barton, D.; Urban, F. K., III

fiu authors

publication date

  • 2011

Digital Object Identifier (DOI)

volume

  • 29

issue

  • 4

research area