Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane Article

Urban, F. K., III, Barton, D.. (2011). Numerical ellipsometry: Advanced analysis of thin absorbing films in the n-k plane . THIN SOLID FILMS, 519(19), 6284-6289. 10.1016/j.tsf.2011.03.133



cited authors

  • Urban, F. K., III; Barton, D.

fiu authors

publication date

  • 2011

published in

Digital Object Identifier (DOI)

start page

  • 6284

end page

  • 6289

volume

  • 519

issue

  • 19

research area