Cross-validation and evaluation of the performance of methods for the elemental analysis of forensic glass by mu-XRF, ICP-MS, and LA-ICP-MS

Trejos, Tatiana; Koons, Robert; Becker, Stefan; Berman, Ted; Buscaglia, JoAnn; Duecking, Marc; Eckert-Lumsdon, Tiffany; Ernst, Troy; Hanlon, Christopher; Heydon, Alex; Mooney, Kim; Nelson, Randall; Olsson, Kristine; Palenik, Christopher; Pollock, Edward Chip; Rudell, David; Ryland, Scott; Tarifa, Anamary; Valadez, Melissa; Weis, Peter; Almirall, Jose

Cross-validation and evaluation of the performance of methods for the elemental analysis of forensic glass by mu-XRF, ICP-MS, and LA-ICP-MS Article