Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane Article

Urban, F. K., III, Barton, D.. (2014). Numerical ellipsometry: High accuracy modeling of thin absorbing films in the n-k plane . THIN SOLID FILMS, 562 49-55. 10.1016/j.tsf.2014.03.067



cited authors

  • Urban, F. K., III; Barton, D.

fiu authors

publication date

  • 2014

published in

Digital Object Identifier (DOI)

start page

  • 49

end page

  • 55

volume

  • 562

research area