Large area strain analysis using scanning transmission electron microscopy across multiple images Article

cited authors

  • Oni, A. A.; Sang, X.; Raju, S. V.; Dumpala, S.; Broderick, S.; Kumar, A.; Sinnott, S.; Saxena, S.; Rajan, K.; LeBeau, J. M.

publication date

  • 2015

published in

Digital Object Identifier (DOI)

volume

  • 106

issue

  • 1

research area

  • Physics  Web of Science Research Area