Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates Article

Urban, F. K., III, Barton, D.. (2015). Numerical ellipsometry: Examination of growing nickel and rhenium thin films using n-k plane analysis and effective numerical substrates . THIN SOLID FILMS, 583 239-244. 10.1016/j.tsf.2015.03.062



cited authors

  • Urban, F. K., III; Barton, D.

fiu authors

publication date

  • 2015

published in

Digital Object Identifier (DOI)

start page

  • 239

end page

  • 244

volume

  • 583

research area