Localization of multiple defects using the compact phased array (CPA) method Article

cited authors

  • Senyurek, Volkan Y.; Baghalian, Amin; Tashakori, Shervin; McDaniel, Dwayne; Tansel, Ibrahim N.

publication date

  • 2018

published in

Digital Object Identifier (DOI)

start page

  • 383

end page

  • 394

volume

  • 413

research area