Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to beta-gallium oxide Article

Urban, Frank K., III, Barton, David, Schubert, Mathias. (2020). Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to beta-gallium oxide . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 38(2), 10.1116/1.5134790



cited authors

  • Urban, Frank K., III; Barton, David; Schubert, Mathias

fiu authors

publication date

  • March 1, 2020

webpage

category

Digital Object Identifier (DOI)

volume

  • 38

issue

  • 2