Generation-recombination noise and photo-induced transient conductivity in epitaxial CdHgTe long wavelength infrared detectors

Generation-recombination noise and photo-induced transient conductivity in epitaxial CdHgTe long wavelength infrared detectors Proceedings Paper

cited authors

Paul, N; Van Vliet, CM; Mergui, S; Triboulet, R; Capper, P; MullerVogt, G

publication date

1999

webpage

Web of Science™

published in

GROWTH, CHARACTERISATION AND APPLICATIONS OF BULK II-VIS Book

author keyword

generation-recombination processes Author Keyword
interface-states Author Keyword
noise Author Keyword
traps Author Keyword
vacancies Author Keyword

category

MATERIALS SCIENCE, CHARACTERIZATION & TESTING Web of Science Category
PHYSICS, CONDENSED MATTER Web of Science Category

volume

78

research area

Materials Science Web of Science Research Area
Physics Web of Science Research Area