Generation-recombination noise and photo-induced transient conductivity in epitaxial CdHgTe long wavelength infrared detectors Proceedings Paper

Paul, N, Van Vliet, CM, Mergui, S et al. (1999). Generation-recombination noise and photo-induced transient conductivity in epitaxial CdHgTe long wavelength infrared detectors . GROWTH, CHARACTERISATION AND APPLICATIONS OF BULK II-VIS, 78



cited authors

  • Paul, N; Van Vliet, CM; Mergui, S; Triboulet, R; Capper, P; MullerVogt, G

publication date

  • 1999

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  • 78

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