Characterization of Line Nanopatterns on Positive Photoresist Produced by Scanning Near-Field Optical Microscope Article

Aghaei, Sadegh Mehdi, Yasrebi, Navid, Rashidian, Bizhan. (2015). Characterization of Line Nanopatterns on Positive Photoresist Produced by Scanning Near-Field Optical Microscope . JOURNAL OF NANOMATERIALS, 10.1155/2015/936876



Open Access International Collaboration

cited authors

  • Aghaei, Sadegh Mehdi; Yasrebi, Navid; Rashidian, Bizhan

publication date

  • 2015

published in

Digital Object Identifier (DOI)

research area