Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films Article Proceedings Paper

Urban, F. K., II, Barton, D.. (2018). Numerical ellipsometry: Use of parameter sensitivity to guide measurement selection for transparent anisotropic films . THIN SOLID FILMS, 663 10.1016/j.tsf.2018.07.047



cited authors

  • Urban, F. K., II; Barton, D.

fiu authors

publication date

  • October 2018

published in

Digital Object Identifier (DOI)

volume

  • 663