Analysis of surface void fraction using atomic force microscopy Article Proceedings Paper

Lindquist, CS, Urban, FK. (1996). Analysis of surface void fraction using atomic force microscopy . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 14(3), 10.1116/1.580367



cited authors

  • Lindquist, CS; Urban, FK

fiu authors

publication date

  • 1996

category

Digital Object Identifier (DOI)

volume

  • 14

issue

  • 3

research area