Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry

Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry Article

cited authors

Athey, PR; Urban, FK; Holloway, PH

fiu authors

Urban, Frank

publication date

1996

webpage

Web of Science™

published in

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Journal

category

ENGINEERING, ELECTRICAL & ELECTRONIC Web of Science Category
NANOSCIENCE & NANOTECHNOLOGY Web of Science Category
PHYSICS, APPLIED Web of Science Category

volume

14

issue

6

research area

Engineering Web of Science Research Area
Physics Web of Science Research Area
Science & Technology - Other Topics Web of Science Research Area