Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry Article

Athey, PR, Urban, FK, Holloway, PH. (1996). Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry . JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 14(6),



cited authors

  • Athey, PR; Urban, FK; Holloway, PH

fiu authors

publication date

  • 1996

volume

  • 14

issue

  • 6

research area