Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry Article
Athey, PR, Urban, FK, Holloway, PH. (1996). Use of multiple analytical techniques to confirm improved optical modeling of SnO2:F films by atomic force microscopy and spectroscopic ellipsometry
. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 14(6),