Deconvolution of tip affected atomic force microscope images and comparison to Rutherford backscattering spectrometry

Deconvolution of tip affected atomic force microscope images and comparison to Rutherford backscattering spectrometry Article Proceedings Paper

cited authors

Tabet, MF; Urban, FK

fiu authors

Urban, Frank

publication date

1997

webpage

Web of Science™

published in

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B Journal

category

ENGINEERING, ELECTRICAL & ELECTRONIC Web of Science Category
NANOSCIENCE & NANOTECHNOLOGY Web of Science Category
PHYSICS, APPLIED Web of Science Category

Digital Object Identifier (DOI)

https://doi.org/10.1116/1.589412

volume

15

issue

4

research area

Engineering Web of Science Research Area
Physics Web of Science Research Area
Science & Technology - Other Topics Web of Science Research Area