Trace elemental analysis of glass and paint samples of forensic interest by ICP-MS using Laser Ablation solid sample introduction Conference

Almirall, JR, Trejos, T, Hobbs, A et al. (2003). Trace elemental analysis of glass and paint samples of forensic interest by ICP-MS using Laser Ablation solid sample introduction . 5071 193-204. 10.1117/12.498106

cited authors

  • Almirall, JR; Trejos, T; Hobbs, A; Furton, K

date/time interval

  • April 21, 2003 -

publication date

  • January 1, 2003
  • April 21, 2003

keywords

  • Computer Science
  • Computer Science, Interdisciplinary Applications
  • ICPMS
  • Imaging Science & Photographic Technology
  • Instruments & Instrumentation
  • LA-ICP-MS
  • Physical Sciences
  • Physics
  • Physics, Applied
  • REFRACTIVE-INDEX
  • Science & Technology
  • Technology
  • Telecommunications
  • VARIANCE
  • forensic comparisons
  • glass evidence
  • paint evidence

Location

  • ORLANDO, FL

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 10

  • 0-8194-4930-X

Conference

  • Conference on Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Defense and Law Enforcement II

start page

  • 193

end page

  • 204

volume

  • 5071