Studies of C60 single crystals and thin films by photothermal deflection spectroscopy Article

cited authors

  • Zhou, WY; Xie, SS; Qian, SF; Zhao, RA; Wang, G; Qian, LX; Li, WZ

fiu authors

abstract

  • We have measured the photothermal deflection spectra (PDS) of C60 single crystals grown from gas and liquid phase and the thin films prepared by sublimation method. And the PDS of C60 S16 crystals were also measured. The measurements were compared with that of amorphous semiconductors. For these samples, the optical energy gaps, Eopt, were obtained by using the Tauc's plots, and the Urbach edges were calculated. The weak absorption properties of these C60 solids were discussed.

publication date

  • December 1, 1997

start page

  • 168

end page

  • 169

volume

  • 46

issue

  • 1