Attachment and withdrawal patterns of high technology workers Article

cited authors

  • Von Glinow, MA; Mohrman, SA

fiu authors

abstract

  • Employee attachment and withdrawal was examined for a sample of high technology electronics workers located in the Silicon Valley. The effects of current and future expectations were compared as predictors of job responses for high tech workers at different job tenure stages (newcomers, insiders, and long-term veterans). A survey based multivariate approach with in-depth interviews was used. Results portray a high turnover pattern for newcomers who want, but do not expect to receive promotional opportunities and enriched jobs. The effect of job longevity remains unresolved. © 1990.

publication date

  • January 1, 1990

Digital Object Identifier (DOI)

start page

  • 149

end page

  • 165

volume

  • 1

issue

  • 2