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Attachment and withdrawal patterns of high technology workers
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Von Glinow, MA, Mohrman, SA. (1990). Attachment and withdrawal patterns of high technology workers .
1(2), 149-165. 10.1016/1047-8310(90)90003-M
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Von Glinow, MA, Mohrman, SA. (1990). Attachment and withdrawal patterns of high technology workers .
1(2), 149-165. 10.1016/1047-8310(90)90003-M
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cited authors
Von Glinow, MA; Mohrman, SA
fiu authors
Von Glinow, Mary Ann
abstract
Employee attachment and withdrawal was examined for a sample of high technology electronics workers located in the Silicon Valley. The effects of current and future expectations were compared as predictors of job responses for high tech workers at different job tenure stages (newcomers, insiders, and long-term veterans). A survey based multivariate approach with in-depth interviews was used. Results portray a high turnover pattern for newcomers who want, but do not expect to receive promotional opportunities and enriched jobs. The effect of job longevity remains unresolved. © 1990.
publication date
January 1, 1990
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Digital Object Identifier (DOI)
https://doi.org/10.1016/1047-8310(90)90003-m
Additional Document Info
start page
149
end page
165
volume
1
issue
2