Interface characterization of chemical-vapour-deposited diamond on Cu and Pt substrates studied by transmission electron microscopy Conference

cited authors

  • Jiang, N; Wang, CL; Won, JH; Joen, MH; Mori, Y; Hatta, A; Ito, T; Sasaki, T; Hiraki, A

fiu authors

keywords

  • CVD diamond
  • Chemistry
  • Chemistry, Physical
  • Cu and Pt substrates
  • HREM
  • Materials Science
  • Materials Science, Coatings & Films
  • Physical Sciences
  • Physics
  • Physics, Condensed Matter
  • Science & Technology
  • intermediate layer

Location

  • KARUIZAWA, JAPAN

Conference

  • 2nd International Symposium on the Control of Semiconductor Interfaces (ISCSI-2)

start page

  • 587

end page

  • 591