Dynamic effects in microparticle pull-off using an AFM

Dynamic effects in microparticle pull-off using an AFM Article

Kaushik, A, Srinivasa, AR, Phares, DJ. (2007). Dynamic effects in microparticle pull-off using an AFM . 25(5), 387-399. 10.1080/02726350701487157

cited authors

Kaushik, A; Srinivasa, AR; Phares, DJ

fiu authors

Kaushik, Ajeet

publication date

January 1, 2007

webpage

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000250171100001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=e451fd656366bf1ec5554941920a9ccb

keywords

ADHESION
Engineering
Engineering, Chemical
FLAT SUBSTRATE
FORCE MICROSCOPY
NANOASPERITY CONTACTS
PARTICLES
RESUSPENSION
SIZE
SURFACE-ENERGY
Science & Technology
Technology
VAN-DER-WAALS
WATER
atomic force microscopy
dynamic model
microparticle detachment from surface
pull-off velocity

Digital Object Identifier (DOI)

https://doi.org/10.1080/02726350701487157

start page

387

end page

399

volume

25

issue

5