Microscopy (Electron) Book Chapter

Houck, MM. (2013). Microscopy (Electron) . 612-615. 10.1016/B978-0-12-382165-2.00252-X

cited authors

  • Houck, MM

fiu authors

abstract

  • Electron microscopy, typically the scanning type, is a mainstay of the modern forensic laboratory. Combining high resolution, increased depth of field, and superb magnification, the scanning electron microscope (SEM) offers unparalleled views of small to trace materials. Additional analytical equipment offering elemental, chemical, and structural analysis makes the SEM indispensable to forensic scientists.

publication date

  • January 1, 2013

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 13

  • 9780123821669

start page

  • 612

end page

  • 615