Effect of content on microstructure and dielectric performance of PI/Al2O3 hybrid films Conference

Liu, X, Yin, J, Chen, M et al. (2011). Effect of content on microstructure and dielectric performance of PI/Al2O3 hybrid films . 3(2), 226-229. 10.1166/nnl.2011.1158



cited authors

  • Liu, X; Yin, J; Chen, M; Bu, W; Cheng, W; Wu, Z

fiu authors

abstract

  • Al2O3/PI hybrid films were prepared by sol-gel method and their microstructures were investigated by synchrotron radiation small angle X-ray scattering (SAXS) technique. SAXS results indicate that most probable radius of the nanoparticles in hybrid films increase from 9.3 to 13.2 nm, and the scattering curves in the high-angle region show negative deviation from Debye's theory, which suggests that there are obvious interface layers between the organic and the inorganic phases in the PI films. Nanoparticles also have mass fractal and surface fractal structure. With the increase of Al 2O3 content, not only the thickness of interface layers and specific surface area increase from 0.53 to 1.47 nm, 0.12 to 0.81 nm-1, respectively, but also the surface fractal dimension rises while mass fractal dimension decreases, showing that doped particles become looser. The anchoring of polymer chains is enhanced and the number of anchored point increases, which roughen the surfaces. Finally, the effects of content on the volume conductivity, loss tangent, permittivity and breakdown field strength are analyzed with percolation theory and polarization theory. Copyright © 2011 American Scientific Publishers.

publication date

  • April 1, 2011

Digital Object Identifier (DOI)

start page

  • 226

end page

  • 229

volume

  • 3

issue

  • 2