Synchrotron X-ray study on structures of Ni80Fe20/Cu superlattices Article

Xu, M, Luo, GM, Chai, CL et al. (2001). Synchrotron X-ray study on structures of Ni80Fe20/Cu superlattices . 18(3), 405-407. 10.1088/0256-307X/18/3/332



cited authors

  • Xu, M; Luo, GM; Chai, CL; Yang, T; Mai, ZH; Lai, WY; Wu, ZH; Wang, DW

fiu authors

abstract

  • We have shown that, in contrast to the results in the literature, the Bragg peak intensity of Ni80Fe20/Cu superlattices is enhanced at the incident x-ray energy slightly higher than the absorption edge of the heavier element (Cu). The atomic density at Ni80Fe20/Cu interface was analysed by the diffraction anomalous fine structure technology with the incident angle of x-ray fixed at the first Bragg peak. Our results demonstrate the epitaxy growth of Ni80Fe20/Cu superlattices. Upon annealing, the epitaxity of Ni80Fe20/Cu multilayers becomes poor but the local crystallinity in each layer is improved.

publication date

  • March 1, 2001

Digital Object Identifier (DOI)

start page

  • 405

end page

  • 407

volume

  • 18

issue

  • 3