Microstructure analysis of D-RDX by small angle X-ray scattering Article

Yan, G, Huang, C, Xia, Q et al. (2010). Microstructure analysis of D-RDX by small angle X-ray scattering . 33(3), 161-164.



cited authors

  • Yan, G; Huang, C; Xia, Q; Chen, B; Huang, M; Nie, F; Wu, Z

fiu authors

abstract

  • The micro-defects of D-RDX were analyzed by small angle X-ray scattering (SAXS). Scale and density of micro-defects in the D-RDX of different the qualities during the crystal growing were investigated. The results show that the larger D-RDX crystals have less micro-defect density and better crystal quality. Micro-defects with orientated distributions in the D-RDX indicated anisotropic microstructure in D-RDX.

publication date

  • March 1, 2010

start page

  • 161

end page

  • 164

volume

  • 33

issue

  • 3