On the characterization of metallic superlattice structures by X-ray diffraction Article

Xu, M, Yu, W, Luo, G et al. (1999). On the characterization of metallic superlattice structures by X-ray diffraction . 13(19), 663-669. 10.1142/S021798499900083X



cited authors

  • Xu, M; Yu, W; Luo, G; Chai, C; Zhao, T; Chen, F; Mai, Z; Lai, W; Wu, Z; Wang, D

fiu authors

abstract

  • To solve the problem on the microstructural characterization of metallic superlattices, taking the NiFe/Cu superlattices as example, we show that the structures of metallic superlattices can be characterized exactly by combining low-angle X-ray diffraction with high-angle X-ray diffraction. First, we determine exactly the total film thickness by a straightforward and precise method based on a modified Bragg law from the subsidiary maxima around the low-angle X-ray diffraction peak. Then, by combining with the simulation of high-angle X-ray diffraction, we obtain the structural parameters such as the superlattice period, the sublayer and buffer thickness. This characterization procedure is also applicable to other types of metallic superlattices. © World Scientific Publishing Company.

publication date

  • August 20, 1999

Digital Object Identifier (DOI)

start page

  • 663

end page

  • 669

volume

  • 13

issue

  • 19