Substrate stress effect on phase transition properties of ferroelectric films from Landau theory Conference

Wang, CL, Wang, XS, Xin, Y et al. (2000). Substrate stress effect on phase transition properties of ferroelectric films from Landau theory . 4086 707-710. 10.1117/12.408360

cited authors

  • Wang, CL; Wang, XS; Xin, Y; Zhong, WL; Zhang, PL

fiu authors

date/time interval

  • May 8, 2000 -

publication date

  • January 1, 2000
  • May 8, 2000

keywords

  • Landau theory
  • Materials Science
  • Materials Science, Coatings & Films
  • Physical Sciences
  • Physics
  • Physics, Applied
  • Science & Technology
  • THIN-FILMS
  • Technology
  • ferroelectric films
  • stress

Location

  • SHANGHAI, PEOPLES R CHINA

Digital Object Identifier (DOI)

International Standard Book Number (ISBN) 10

  • 0-8194-3729-8

Conference

  • 4th International Conference on Thin Film Physics and Applications

start page

  • 707

end page

  • 710

volume

  • 4086