On the surface mapping using individual cluster impacts Article

keywords

  • Cluster-SIMS
  • ELECTRON-EMISSION
  • Electron emission
  • ION EMISSION
  • Instruments & Instrumentation
  • Nuclear Science & Technology
  • PHOTON
  • PROBE
  • Photon emission
  • Physical Sciences
  • Physics
  • Physics, Atomic, Molecular & Chemical
  • Physics, Nuclear
  • Science & Technology
  • Secondary ion yield
  • Technology

Location

  • Univ Fed Rio Grande Sul (UFRGS), Inst Phys, Ion Implantat Lab, Itapema, BRAZIL

Digital Object Identifier (DOI)

start page

  • 270

end page

  • 273

volume

  • 273